Strix
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CVE-2017-8182

UnknownEPSS 0.52%

Last modified

CVE-2017-8182 is a vulnerability of currently unknown severity. MTK platform in Huawei smart phones with software of earlier than Nice-AL00C00B160 versions, earlier than Nice-AL10C00B140 versions has a out-of-bound read vulnerability. An attacker tricks a user into installing a malicious application on the smart phone, and send given parameter and cause to memory out-of-bound read.. EPSS estimates a 0.52% chance of exploitation in the next 30 days.

Description

MTK platform in Huawei smart phones with software of earlier than Nice-AL00C00B160 versions, earlier than Nice-AL10C00B140 versions has a out-of-bound read vulnerability. An attacker tricks a user into installing a malicious application on the smart phone, and send given parameter and cause to memory out-of-bound read.

Metrics

EPSS Probability
0.52%

40.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
HuaweiMtk Platform Smart Phone Firmware< nice-al10c00b140
HuaweiMtk Platform Smart Phone Firmware< nice-al00c00b160

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2017-8182?
MTK platform in Huawei smart phones with software of earlier than Nice-AL00C00B160 versions, earlier than Nice-AL10C00B140 versions has a out-of-bound read vulnerability. An attacker tricks a user into installing a malicious application on the smart phone, and send given parameter and cause to memory out-of-bound read.
How severe is CVE-2017-8182?
Severity scoring for CVE-2017-8182 is pending analysis. The EPSS model estimates a 0.52% probability of exploitation in the next 30 days.
How do I fix CVE-2017-8182?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-8182?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST