CVE-2017-8257

Name: CVE-2017-8257
Creator: NVD / NIST
Published: 2017-08-18T18:29:03.61+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 0.28%

Last modified Jun 17, 2026

CVE-2017-8257 is a vulnerability of currently unknown severity. In all Qualcomm products with Android releases from CAF using the Linux kernel, when accessing the sde_rotator debug interface for register reading with multiple processes, one process can free the debug buffer while another process still has the debug buffer in use.. EPSS estimates a 0.28% chance of exploitation in the next 30 days.

Description

In all Qualcomm products with Android releases from CAF using the Linux kernel, when accessing the sde_rotator debug interface for register reading with multiple processes, one process can free the debug buffer while another process still has the debug buffer in use.

Metrics

EPSS Probability

0.28%

19.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-362

Affected Software

Vendor	Product	Versions
Google	Android	All versions

References

http://www.securityfocus.com/bid/99465Third Party Advisory, VDB Entry
https://source.android.com/security/bulletin/2017-07-01Patch, Vendor Advisory
http://www.securityfocus.com/bid/99465Third Party Advisory, VDB Entry
https://source.android.com/security/bulletin/2017-07-01Patch, Vendor Advisory

Timeline

Published: Aug 18, 2017
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2017-8257?

How severe is CVE-2017-8257?

Severity scoring for CVE-2017-8257 is pending analysis. The EPSS model estimates a 0.28% probability of exploitation in the next 30 days.

How do I fix CVE-2017-8257?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-8257?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST