CVE-2018-10519

UnknownEPSS 1.01%

Last modified

CVE-2018-10519 is a vulnerability of currently unknown severity. CMS Made Simple (CMSMS) 2.2.7 contains a privilege escalation vulnerability from ordinary user to admin user by arranging for the eff_uid value within $_COOKIE[$this->_loginkey] to equal 1, because files in the tmp/ directory are accessible through HTTP requests. NOTE: this vulnerability exists because of an incorrect fix for CVE-2018-10084.. EPSS estimates a 1.01% chance of exploitation in the next 30 days.

Description

CMS Made Simple (CMSMS) 2.2.7 contains a privilege escalation vulnerability from ordinary user to admin user by arranging for the eff_uid value within $_COOKIE[$this->_loginkey] to equal 1, because files in the tmp/ directory are accessible through HTTP requests. NOTE: this vulnerability exists because of an incorrect fix for CVE-2018-10084.

Metrics

EPSS Probability
1.01%

58.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
CmsmadesimpleCms Made Simple2.2.7

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2018-10519?
CMS Made Simple (CMSMS) 2.2.7 contains a privilege escalation vulnerability from ordinary user to admin user by arranging for the eff_uid value within $_COOKIE[$this->_loginkey] to equal 1, because files in the tmp/ directory are accessible through HTTP requests. NOTE: this vulnerability exists because of an incorrect fix for CVE-2018-10084.
How severe is CVE-2018-10519?
Severity scoring for CVE-2018-10519 is pending analysis. The EPSS model estimates a 1.01% probability of exploitation in the next 30 days.
How do I fix CVE-2018-10519?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2018-10519?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST