CVE-2018-10709

UnknownEPSS 1.17%

Last modified

CVE-2018-10709 is a vulnerability of currently unknown severity. The AsrDrv101.sys and AsrDrv102.sys low-level drivers in ASRock RGBLED before v1.0.35.1, A-Tuning before v3.0.210, F-Stream before v3.0.210, and RestartToUEFI before v1.0.6.2 expose functionality to read and write CR register values. This could be leveraged in a number of ways to ultimately run code with elevated privileges.. EPSS estimates a 1.17% chance of exploitation in the next 30 days.

Description

The AsrDrv101.sys and AsrDrv102.sys low-level drivers in ASRock RGBLED before v1.0.35.1, A-Tuning before v3.0.210, F-Stream before v3.0.210, and RestartToUEFI before v1.0.6.2 expose functionality to read and write CR register values. This could be leveraged in a number of ways to ultimately run code with elevated privileges.

Metrics

EPSS Probability
1.17%

63.4th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
AsrockA-Tuning< 3.0.210
AsrockF-Stream< 3.0.210
AsrockRestart To Uefi< 1.0.6.2
AsrockRgbled< 1.0.35.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2018-10709?
The AsrDrv101.sys and AsrDrv102.sys low-level drivers in ASRock RGBLED before v1.0.35.1, A-Tuning before v3.0.210, F-Stream before v3.0.210, and RestartToUEFI before v1.0.6.2 expose functionality to read and write CR register values. This could be leveraged in a number of ways to ultimately run code with elevated privileges.
How severe is CVE-2018-10709?
Severity scoring for CVE-2018-10709 is pending analysis. The EPSS model estimates a 1.17% probability of exploitation in the next 30 days.
How do I fix CVE-2018-10709?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2018-10709?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST