CVE-2018-14856

UnknownEPSS 0.95%

Last modified

CVE-2018-14856 is a vulnerability of currently unknown severity. Buffer overflow in dhd_bus_flow_ring_create_response in drivers/net/wireless/bcmdhd4358/dhd_pcie.c in the bcmdhd4358 Wi-Fi driver on the Samsung Galaxy S6 SM-G920F G920FXXU5EQH7 allow an attacker (who has obtained code execution on the Wi-Fi) chip to cause the device driver to perform invalid memory accesses. The Samsung ID is SVE-2018-11785.. EPSS estimates a 0.95% chance of exploitation in the next 30 days.

Description

Buffer overflow in dhd_bus_flow_ring_create_response in drivers/net/wireless/bcmdhd4358/dhd_pcie.c in the bcmdhd4358 Wi-Fi driver on the Samsung Galaxy S6 SM-G920F G920FXXU5EQH7 allow an attacker (who has obtained code execution on the Wi-Fi) chip to cause the device driver to perform invalid memory accesses. The Samsung ID is SVE-2018-11785.

Metrics

EPSS Probability
0.95%

56.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
SamsungGalaxy S6 Firmwareg920fxxu5eqh7

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2018-14856?
Buffer overflow in dhd_bus_flow_ring_create_response in drivers/net/wireless/bcmdhd4358/dhd_pcie.c in the bcmdhd4358 Wi-Fi driver on the Samsung Galaxy S6 SM-G920F G920FXXU5EQH7 allow an attacker (who has obtained code execution on the Wi-Fi) chip to cause the device driver to perform invalid memory accesses. The Samsung ID is SVE-2018-11785.
How severe is CVE-2018-14856?
Severity scoring for CVE-2018-14856 is pending analysis. The EPSS model estimates a 0.95% probability of exploitation in the next 30 days.
How do I fix CVE-2018-14856?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2018-14856?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST