CVE-2018-17407

UnknownEPSS 2.06%

Last modified

CVE-2018-17407 is a vulnerability of currently unknown severity. An issue was discovered in t1_check_unusual_charstring functions in writet1.c files in TeX Live before 2018-09-21. A buffer overflow in the handling of Type 1 fonts allows arbitrary code execution when a malicious font is loaded by one of the vulnerable tools: pdflatex, pdftex, dvips, or luatex.. EPSS estimates a 2.06% chance of exploitation in the next 30 days.

Description

An issue was discovered in t1_check_unusual_charstring functions in writet1.c files in TeX Live before 2018-09-21. A buffer overflow in the handling of Type 1 fonts allows arbitrary code execution when a malicious font is loaded by one of the vulnerable tools: pdflatex, pdftex, dvips, or luatex.

Metrics

EPSS Probability
2.06%

78.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
TugTex Live< 2018-09-21
CanonicalUbuntu Linux14.04
CanonicalUbuntu Linux16.04
CanonicalUbuntu Linux18.04
CanonicalUbuntu Linux18.10
DebianDebian Linux8.0
DebianDebian Linux9.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2018-17407?
An issue was discovered in t1_check_unusual_charstring functions in writet1.c files in TeX Live before 2018-09-21. A buffer overflow in the handling of Type 1 fonts allows arbitrary code execution when a malicious font is loaded by one of the vulnerable tools: pdflatex, pdftex, dvips, or luatex.
How severe is CVE-2018-17407?
Severity scoring for CVE-2018-17407 is pending analysis. The EPSS model estimates a 2.06% probability of exploitation in the next 30 days.
How do I fix CVE-2018-17407?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2018-17407?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST