CVE-2018-17896

UnknownEPSS 1.21%

Last modified

CVE-2018-17896 is a vulnerability of currently unknown severity. Yokogawa STARDOM Controllers FCJ, FCN-100, FCN-RTU, FCN-500, All versions R4.10 and prior, The affected controllers utilize hard-coded credentials which may allow an attacker gain unauthorized access to the maintenance functions and obtain or modify information. This attack can be executed only during maintenance work.. EPSS estimates a 1.21% chance of exploitation in the next 30 days.

Description

Yokogawa STARDOM Controllers FCJ, FCN-100, FCN-RTU, FCN-500, All versions R4.10 and prior, The affected controllers utilize hard-coded credentials which may allow an attacker gain unauthorized access to the maintenance functions and obtain or modify information. This attack can be executed only during maintenance work.

Metrics

EPSS Probability
1.21%

64.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
YokogawaFcj Firmware<= r4.10
YokogawaFcn-100 Firmware<= r4.10
YokogawaFcn-Rtu Firmware<= r4.10
YokogawaFcn-500 Firmware<= r4.10

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2018-17896?
Yokogawa STARDOM Controllers FCJ, FCN-100, FCN-RTU, FCN-500, All versions R4.10 and prior, The affected controllers utilize hard-coded credentials which may allow an attacker gain unauthorized access to the maintenance functions and obtain or modify information. This attack can be executed only during maintenance work.
How severe is CVE-2018-17896?
Severity scoring for CVE-2018-17896 is pending analysis. The EPSS model estimates a 1.21% probability of exploitation in the next 30 days.
How do I fix CVE-2018-17896?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2018-17896?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST