CVE-2018-1970

Name: CVE-2018-1970
Creator: NVD / NIST
Published: 2019-02-04T21:29:00.533+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 1.85%

Last modified Jun 17, 2026

CVE-2018-1970 is a vulnerability of currently unknown severity. IBM Security Identity Manager 7.0.1 is vulnerable to a XML External Entity Injection (XXE) attack when processing XML data. A remote attacker could exploit this vulnerability to expose sensitive information or consume memory resources. EPSS estimates a 1.85% chance of exploitation in the next 30 days.

Description

IBM Security Identity Manager 7.0.1 is vulnerable to a XML External Entity Injection (XXE) attack when processing XML data. A remote attacker could exploit this vulnerability to expose sensitive information or consume memory resources. IBM X-Force ID: 153751.

Metrics

EPSS Probability

1.85%

76.4th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-611

Affected Software

Vendor	Product	Versions
Ibm	Security Access Manager	>= 7.0.1, <= 7.0.1.10

References

http://www.ibm.com/support/docview.wss?uid=ibm10796380Patch, Vendor Advisory
https://exchange.xforce.ibmcloud.com/vulnerabilities/153751VDB Entry, Vendor Advisory
http://www.ibm.com/support/docview.wss?uid=ibm10796380Patch, Vendor Advisory
https://exchange.xforce.ibmcloud.com/vulnerabilities/153751VDB Entry, Vendor Advisory

Timeline

Published: Feb 4, 2019
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2018-1970?

How severe is CVE-2018-1970?

Severity scoring for CVE-2018-1970 is pending analysis. The EPSS model estimates a 1.85% probability of exploitation in the next 30 days.

How do I fix CVE-2018-1970?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2018-1970?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST