CVE-2018-5841

Name: CVE-2018-5841
Creator: NVD / NIST
Published: 2018-06-06T21:29:00.55+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 0.39%

Last modified Jun 17, 2026

CVE-2018-5841 is a vulnerability of currently unknown severity. dcc_curr_list is initialized with a default invalid value that is expected to be programmed by the user through a sysfs node which could lead to an invalid access in all Android releases from CAF (Android for MSM, Firefox OS for MSM, QRD Android) using the Linux Kernel.. EPSS estimates a 0.39% chance of exploitation in the next 30 days.

Description

dcc_curr_list is initialized with a default invalid value that is expected to be programmed by the user through a sysfs node which could lead to an invalid access in all Android releases from CAF (Android for MSM, Firefox OS for MSM, QRD Android) using the Linux Kernel.

Metrics

EPSS Probability

0.39%

30.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-1188

Affected Software

Vendor	Product	Versions
Google	Android	All versions

References

https://www.codeaurora.org/security-bulletin/2018/05/11/may-2018-code-aurora-security-bulletin-2Patch, Third Party Advisory
https://source.android.com/security/bulletin/2018-05-01Patch, Vendor Advisory
https://www.codeaurora.org/security-bulletin/2018/05/11/may-2018-code-aurora-security-bulletin-2Patch, Third Party Advisory

Timeline

Published: Jun 6, 2018
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2018-5841?

How severe is CVE-2018-5841?

Severity scoring for CVE-2018-5841 is pending analysis. The EPSS model estimates a 0.39% probability of exploitation in the next 30 days.

How do I fix CVE-2018-5841?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2018-5841?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST