CVE-2018-7906

UnknownEPSS 0.56%

Last modified

CVE-2018-7906 is a vulnerability of currently unknown severity. Some Huawei smart phones with software of Leland-AL00 8.0.0.114(C636), Leland-AL00A 8.0.0.171(C00) have a denial of service (DoS) vulnerability. An attacker can trick a user to install a malicious application to exploit this vulnerability. EPSS estimates a 0.56% chance of exploitation in the next 30 days.

Description

Some Huawei smart phones with software of Leland-AL00 8.0.0.114(C636), Leland-AL00A 8.0.0.171(C00) have a denial of service (DoS) vulnerability. An attacker can trick a user to install a malicious application to exploit this vulnerability. Due to insufficient verification of the parameter, successful exploitation can cause the smartphone black screen until restarting the phone.

Metrics

EPSS Probability
0.56%

42.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
HuaweiLeland-Al00 Firmware8.0.0.114\(c636\)
HuaweiLleland-Al00a Firmware8.0.0.171\(c00\)

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2018-7906?
Some Huawei smart phones with software of Leland-AL00 8.0.0.114(C636), Leland-AL00A 8.0.0.171(C00) have a denial of service (DoS) vulnerability. An attacker can trick a user to install a malicious application to exploit this vulnerability. Due to insufficient verification of the parameter, successful exploitation can cause the smartphone black screen until restarting the phone.
How severe is CVE-2018-7906?
Severity scoring for CVE-2018-7906 is pending analysis. The EPSS model estimates a 0.56% probability of exploitation in the next 30 days.
How do I fix CVE-2018-7906?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2018-7906?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST