CVE-2019-15948

Name: CVE-2019-15948
Creator: NVD / NIST
Published: 2019-11-13T16:15:11.05+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

HIGHCVSS 8.8/10EPSS 2.53%

Last modified Jun 17, 2026

CVE-2019-15948 is a high-severity vulnerability rated 8.8/10 on the CVSS scale. Texas Instruments CC256x and WL18xx dual-mode Bluetooth controller devices, when LE scan mode is used, allow remote attackers to trigger a buffer overflow via a malformed Bluetooth Low Energy advertising packet, to cause a denial of service or potentially execute arbitrary code. This affects CC256xC-BT-SP 1.2, CC256xB-BT-SP 1.8, and WL18xx-BT-SP 4.4.. EPSS estimates a 2.53% chance of exploitation in the next 30 days.

Description

Texas Instruments CC256x and WL18xx dual-mode Bluetooth controller devices, when LE scan mode is used, allow remote attackers to trigger a buffer overflow via a malformed Bluetooth Low Energy advertising packet, to cause a denial of service or potentially execute arbitrary code. This affects CC256xC-BT-SP 1.2, CC256xB-BT-SP 1.8, and WL18xx-BT-SP 4.4.

Metrics

CVSS 3.1

8.8/10

CVSS:3.1/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability

2.53%

82.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-120

Affected Software

Vendor	Product	Versions
Ti	Cc256xc-Bt-Sp Firmware	<= 1.2
Ti	Cc256xb-Bt-Sp Firmware	<= 1.8
Ti	Wl18xx-Bt-Sp Firmware	<= 4.4

References

Timeline

Published: Nov 13, 2019
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2019-15948?

How severe is CVE-2019-15948?

CVE-2019-15948 has a CVSS score of 8.8/10 (HIGH severity). The EPSS model estimates a 2.53% probability of exploitation in the next 30 days.

How do I fix CVE-2019-15948?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2019-15948?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST