CVE-2019-20427

CRITICALCVSS 9.8/10EPSS 4.90%

Last modified

CVE-2019-20427 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. In the Lustre file system before 2.12.3, the ptlrpc module has a buffer overflow and panic, and possibly remote code execution, due to the lack of validation for specific fields of packets sent by a client. Interaction between req_capsule_get_size and tgt_brw_write leads to a tgt_shortio2pages integer signedness error.. EPSS estimates a 4.90% chance of exploitation in the next 30 days.

Description

In the Lustre file system before 2.12.3, the ptlrpc module has a buffer overflow and panic, and possibly remote code execution, due to the lack of validation for specific fields of packets sent by a client. Interaction between req_capsule_get_size and tgt_brw_write leads to a tgt_shortio2pages integer signedness error.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
4.90%

91.0th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LustreLustre< 2.12.3

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2019-20427?
In the Lustre file system before 2.12.3, the ptlrpc module has a buffer overflow and panic, and possibly remote code execution, due to the lack of validation for specific fields of packets sent by a client. Interaction between req_capsule_get_size and tgt_brw_write leads to a tgt_shortio2pages integer signedness error.
How severe is CVE-2019-20427?
CVE-2019-20427 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 4.90% probability of exploitation in the next 30 days.
How do I fix CVE-2019-20427?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2019-20427?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST