CVE-2019-2046

Name: CVE-2019-2046
Creator: NVD / NIST
Published: 2019-05-08T17:29:00.943+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 1.33%

Last modified Jun 17, 2026

CVE-2019-2046 is a vulnerability of currently unknown severity. In CalculateInstanceSizeForDerivedClass of objects.cc, there is possible memory corruption due to an integer overflow. This could lead to remote code execution in the proxy auto-config with no additional execution privileges needed. EPSS estimates a 1.33% chance of exploitation in the next 30 days.

Description

In CalculateInstanceSizeForDerivedClass of objects.cc, there is possible memory corruption due to an integer overflow. This could lead to remote code execution in the proxy auto-config with no additional execution privileges needed. User interaction is not needed for exploitation. Product: Android Versions: Android-7.0 Android-7.1.1 Android-7.1.2 Android-8.0 Android-8.1 Android-9 Android ID: A-117556220

Metrics

EPSS Probability

1.33%

67.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

Vendor	Product	Versions
Google	Android	7.0
Google	Android	7.1.1
Google	Android	7.1.2
Google	Android	8.0
Google	Android	8.1
Google	Android	9.0

References

https://source.android.com/security/bulletin/2019-05-01Vendor Advisory
https://source.android.com/security/bulletin/2019-05-01Vendor Advisory

Timeline

Published: May 8, 2019
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2019-2046?

How severe is CVE-2019-2046?

Severity scoring for CVE-2019-2046 is pending analysis. The EPSS model estimates a 1.33% probability of exploitation in the next 30 days.

How do I fix CVE-2019-2046?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2019-2046?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST