CVE-2019-20607
Last modified
CVE-2019-20607 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. EPSS estimates a 0.88% chance of exploitation in the next 30 days.
Description
An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. The Samsung ID is SVE-2019-14126 (May 2019).
Metrics
CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Android | 7.0 | |
| Android | 7.1.0 | |
| Android | 7.1.1 | |
| Android | 7.1.2 | |
| Android | 8.0 | |
| Android | 8.1 | |
| Android | 9.0 |
References
- https://security.samsungmobile.com/securityUpdate.smsbVendor Advisory
- https://security.samsungmobile.com/securityUpdate.smsbVendor Advisory
Timeline
- Published
- Last Modified
- Status
- Modified
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How Strix Helps
- How Strix found a critical auth bypass in etcdStrix autonomously discovered a critical authentication bypass in etcd, later designated CVE-2026-33413.
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