CVE-2019-2105

Name: CVE-2019-2105
Creator: NVD / NIST
Published: 2019-07-08T18:15:11.167+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 0.71%

Last modified Jun 17, 2026

CVE-2019-2105 is a vulnerability of currently unknown severity. In FileInputStream::Read of file_input_stream.cc, there is a possible memory corruption due to uninitialized data. This could lead to remote code execution in an unprivileged process with no additional execution privileges needed. EPSS estimates a 0.71% chance of exploitation in the next 30 days.

Description

In FileInputStream::Read of file_input_stream.cc, there is a possible memory corruption due to uninitialized data. This could lead to remote code execution in an unprivileged process with no additional execution privileges needed. User interaction is needed for exploitation. Product: Android. Versions: Android-7.0 Android-7.1.1 Android-7.1.2 Android-8.0 Android-8.1 Android-9. Android ID: A-116114182.

Metrics

EPSS Probability

0.71%

48.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-908

Affected Software

Vendor	Product	Versions
Google	Android	7.0
Google	Android	7.1.1
Google	Android	7.1.2
Google	Android	8.0
Google	Android	8.1
Google	Android	9.0

References

https://source.android.com/security/bulletin/2019-07-01Vendor Advisory
https://source.android.com/security/bulletin/2019-07-01Vendor Advisory

Timeline

Published: Jul 8, 2019
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2019-2105?

How severe is CVE-2019-2105?

Severity scoring for CVE-2019-2105 is pending analysis. The EPSS model estimates a 0.71% probability of exploitation in the next 30 days.

How do I fix CVE-2019-2105?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2019-2105?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST