CVE-2019-4419

HIGHCVSS 8.2/10EPSS 2.43%

Last modified

CVE-2019-4419 is a high-severity vulnerability rated 8.2/10 on the CVSS scale. IBM Intelligent Operations Center V5.1.0 through V5.2.0 is vulnerable to an XML External Entity Injection (XXE) attack when processing XML data. A remote attacker could exploit this vulnerability to expose sensitive information or consume memory resources. EPSS estimates a 2.43% chance of exploitation in the next 30 days.

Description

IBM Intelligent Operations Center V5.1.0 through V5.2.0 is vulnerable to an XML External Entity Injection (XXE) attack when processing XML data. A remote attacker could exploit this vulnerability to expose sensitive information or consume memory resources. IBM X-Force ID: 162737.

Metrics

CVSS 3.1
8.2/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:N/A:L

EPSS Probability
2.43%

82.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
IbmIntelligent Operations Center>= 5.1.0, <= 5.2.0
IbmIntelligent Operations Center For Emergency Management>= 5.1.0, <= 5.1.0.6
IbmWater Operations For Waternamics>= 5.1.0, <= 5.2.1.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2019-4419?
IBM Intelligent Operations Center V5.1.0 through V5.2.0 is vulnerable to an XML External Entity Injection (XXE) attack when processing XML data. A remote attacker could exploit this vulnerability to expose sensitive information or consume memory resources. IBM X-Force ID: 162737.
How severe is CVE-2019-4419?
CVE-2019-4419 has a CVSS score of 8.2/10 (HIGH severity). The EPSS model estimates a 2.43% probability of exploitation in the next 30 days.
How do I fix CVE-2019-4419?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2019-4419?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST