CVE-2019-5219

Name: CVE-2019-5219
Creator: NVD / NIST
Published: 2019-06-06T15:29:01.203+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 0.55%

Last modified Jun 17, 2026

CVE-2019-5219 is a vulnerability of currently unknown severity. There is a double free vulnerability on certain drivers of Huawei Mate10 smartphones versions earlier than ALP-AL00B 9.0.0.181(C00E87R2P20T8). An attacker tricks the user into installing a malicious application, which makes multiple processes operate the same resource at the same time. EPSS estimates a 0.55% chance of exploitation in the next 30 days.

Description

There is a double free vulnerability on certain drivers of Huawei Mate10 smartphones versions earlier than ALP-AL00B 9.0.0.181(C00E87R2P20T8). An attacker tricks the user into installing a malicious application, which makes multiple processes operate the same resource at the same time. Successful exploit could cause a denial of service condition.

Metrics

EPSS Probability

0.55%

41.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-415

Affected Software

Vendor	Product	Versions
Huawei	Mate 10 Firmware	< alp-al00b_9.0.0.181\(c00e87r2p20t8\)

References

http://www.huawei.com/en/psirt/security-advisories/huawei-sa-20190130-01-smartphone-enVendor Advisory
http://www.huawei.com/en/psirt/security-advisories/huawei-sa-20190130-01-smartphone-enVendor Advisory

Timeline

Published: Jun 6, 2019
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2019-5219?

How severe is CVE-2019-5219?

Severity scoring for CVE-2019-5219 is pending analysis. The EPSS model estimates a 0.55% probability of exploitation in the next 30 days.

How do I fix CVE-2019-5219?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2019-5219?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST