CVE-2019-5308

Name: CVE-2019-5308
Creator: NVD / NIST
Published: 2019-11-29T21:15:11.48+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

LOWCVSS 2.4/10EPSS 0.21%

Last modified Jun 17, 2026

CVE-2019-5308 is a low-severity vulnerability rated 2.4/10 on the CVSS scale. Mate 20 RS smartphones with versions earlier than 9.1.0.135(C786E133R3P1) have an improper authorization vulnerability. The software does not properly restrict certain operation in ADB mode, successful exploit could allow the attacker to switch to third desktop after a series of operation.. EPSS estimates a 0.21% chance of exploitation in the next 30 days.

Description

Mate 20 RS smartphones with versions earlier than 9.1.0.135(C786E133R3P1) have an improper authorization vulnerability. The software does not properly restrict certain operation in ADB mode, successful exploit could allow the attacker to switch to third desktop after a series of operation.

Metrics

CVSS 3.1

2.4/10

CVSS:3.1/AV:P/AC:L/PR:N/UI:N/S:U/C:N/I:L/A:N

EPSS Probability

0.21%

11.0th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

Vendor	Product	Versions
Huawei	Mate 20 Rs Firmware	< 9.1.0.135\(c786e133r3p1\)

References

https://www.huawei.com/en/psirt/security-advisories/huawei-sa-20191127-01-smartphone-enVendor Advisory
https://www.huawei.com/en/psirt/security-advisories/huawei-sa-20191127-01-smartphone-enVendor Advisory

Timeline

Published: Nov 29, 2019
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2019-5308?

How severe is CVE-2019-5308?

CVE-2019-5308 has a CVSS score of 2.4/10 (LOW severity). The EPSS model estimates a 0.21% probability of exploitation in the next 30 days.

How do I fix CVE-2019-5308?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2019-5308?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST