CVE-2019-5644

CRITICALCVSS 9.8/10EPSS 1.32%

Last modified

CVE-2019-5644 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. Computing For Good's Basic Laboratory Information System (also known as C4G BLIS) version 3.5 and earlier suffers from an instance of CWE-284, "Improper Access Control." As a result, an unauthenticated user may alter several facets of a user account, including promoting any user to an administrator.. EPSS estimates a 1.32% chance of exploitation in the next 30 days.

Description

Computing For Good's Basic Laboratory Information System (also known as C4G BLIS) version 3.5 and earlier suffers from an instance of CWE-284, "Improper Access Control." As a result, an unauthenticated user may alter several facets of a user account, including promoting any user to an administrator.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
1.32%

67.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
GatechComputing For Good\'S Basic Laboratory Information System<= 3.5

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2019-5644?
Computing For Good's Basic Laboratory Information System (also known as C4G BLIS) version 3.5 and earlier suffers from an instance of CWE-284, "Improper Access Control." As a result, an unauthenticated user may alter several facets of a user account, including promoting any user to an administrator.
How severe is CVE-2019-5644?
CVE-2019-5644 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 1.32% probability of exploitation in the next 30 days.
How do I fix CVE-2019-5644?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2019-5644?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST