CVE-2020-0165

MEDIUMCVSS 6.7/10EPSS 0.16%

Last modified

CVE-2020-0165 is a medium-severity vulnerability rated 6.7/10 on the CVSS scale. In phNxpNciHal_NfcDep_cmd_ext of phNxpNciHal_NfcDepSWPrio.cc, there is a possible out of bounds write due to a missing bounds check. This could lead to local escalation of privilege via compromised device firmware with System execution privileges needed. EPSS estimates a 0.16% chance of exploitation in the next 30 days.

Description

In phNxpNciHal_NfcDep_cmd_ext of phNxpNciHal_NfcDepSWPrio.cc, there is a possible out of bounds write due to a missing bounds check. This could lead to local escalation of privilege via compromised device firmware with System execution privileges needed. User interaction is not needed for exploitation.Product: AndroidVersions: Android-10Android ID: A-139532977

Metrics

CVSS 3.1
6.7/10

CVSS:3.1/AV:L/AC:L/PR:H/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.16%

5.5th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
GoogleAndroid10.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2020-0165?
In phNxpNciHal_NfcDep_cmd_ext of phNxpNciHal_NfcDepSWPrio.cc, there is a possible out of bounds write due to a missing bounds check. This could lead to local escalation of privilege via compromised device firmware with System execution privileges needed. User interaction is not needed for exploitation.Product: AndroidVersions: Android-10Android ID: A-139532977
How severe is CVE-2020-0165?
CVE-2020-0165 has a CVSS score of 6.7/10 (MEDIUM severity). The EPSS model estimates a 0.16% probability of exploitation in the next 30 days.
How do I fix CVE-2020-0165?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2020-0165?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST