CVE-2020-0213

MEDIUMCVSS 6.5/10EPSS 0.86%

Last modified

CVE-2020-0213 is a medium-severity vulnerability rated 6.5/10 on the CVSS scale. In hevcd_fmt_conv_420sp_to_420sp_av8 of ihevcd_fmt_conv_420sp_to_420sp.s, there is a possible out of bounds write due to a heap buffer overflow. This could lead to remote information disclosure with no additional execution privileges needed. EPSS estimates a 0.86% chance of exploitation in the next 30 days.

Description

In hevcd_fmt_conv_420sp_to_420sp_av8 of ihevcd_fmt_conv_420sp_to_420sp.s, there is a possible out of bounds write due to a heap buffer overflow. This could lead to remote information disclosure with no additional execution privileges needed. User interaction is needed for exploitation. Product: Android Versions: Android-10 Android-11 Android ID: A-143464314

Metrics

CVSS 3.1
6.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:R/S:U/C:H/I:N/A:N

EPSS Probability
0.86%

53.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
GoogleAndroid10.0
GoogleAndroid11.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2020-0213?
In hevcd_fmt_conv_420sp_to_420sp_av8 of ihevcd_fmt_conv_420sp_to_420sp.s, there is a possible out of bounds write due to a heap buffer overflow. This could lead to remote information disclosure with no additional execution privileges needed. User interaction is needed for exploitation. Product: Android Versions: Android-10 Android-11 Android ID: A-143464314
How severe is CVE-2020-0213?
CVE-2020-0213 has a CVSS score of 6.5/10 (MEDIUM severity). The EPSS model estimates a 0.86% probability of exploitation in the next 30 days.
How do I fix CVE-2020-0213?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2020-0213?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST