CVE-2020-10045

HIGHCVSS 8.8/10EPSS 1.07%

Last modified

CVE-2020-10045 is a high-severity vulnerability rated 8.8/10 on the CVSS scale. A vulnerability has been identified in SICAM MMU (All versions < V2.05), SICAM SGU (All versions), SICAM T (All versions < V2.18). An error in the challenge-response procedure could allow an attacker to replay authentication traffic and gain access to protected areas of the web application.. EPSS estimates a 1.07% chance of exploitation in the next 30 days.

Description

A vulnerability has been identified in SICAM MMU (All versions < V2.05), SICAM SGU (All versions), SICAM T (All versions < V2.18). An error in the challenge-response procedure could allow an attacker to replay authentication traffic and gain access to protected areas of the web application.

Metrics

CVSS 3.1
8.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:R/S:U/C:H/I:H/A:H

EPSS Probability
1.07%

60.5th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
SiemensSicam Mmu Firmware< 2.05
SiemensSicam Sgu FirmwareAll versions
SiemensSicam T Firmware< 2.18

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2020-10045?
A vulnerability has been identified in SICAM MMU (All versions < V2.05), SICAM SGU (All versions), SICAM T (All versions < V2.18). An error in the challenge-response procedure could allow an attacker to replay authentication traffic and gain access to protected areas of the web application.
How severe is CVE-2020-10045?
CVE-2020-10045 has a CVSS score of 8.8/10 (HIGH severity). The EPSS model estimates a 1.07% probability of exploitation in the next 30 days.
How do I fix CVE-2020-10045?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2020-10045?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST