CVE-2020-10714

HIGHCVSS 7.5/10EPSS 1.45%

Last modified

CVE-2020-10714 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. A flaw was found in WildFly Elytron version 1.11.3.Final and before. When using WildFly Elytron FORM authentication with a session ID in the URL, an attacker could perform a session fixation attack. EPSS estimates a 1.45% chance of exploitation in the next 30 days.

Description

A flaw was found in WildFly Elytron version 1.11.3.Final and before. When using WildFly Elytron FORM authentication with a session ID in the URL, an attacker could perform a session fixation attack. The highest threat from this vulnerability is to data confidentiality and integrity as well as system availability.

Metrics

CVSS 3.1
7.5/10

CVSS:3.1/AV:N/AC:H/PR:N/UI:R/S:U/C:H/I:H/A:H

EPSS Probability
1.45%

70.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
RedhatWildfly Elytron< 1.11.3
RedhatCodeready Studio12.0
RedhatDescision Manager7.0
RedhatJboss Fuse7.0.0
RedhatProcess Automation7.0
NetappOncommand InsightAll versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2020-10714?
A flaw was found in WildFly Elytron version 1.11.3.Final and before. When using WildFly Elytron FORM authentication with a session ID in the URL, an attacker could perform a session fixation attack. The highest threat from this vulnerability is to data confidentiality and integrity as well as system availability.
How severe is CVE-2020-10714?
CVE-2020-10714 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 1.45% probability of exploitation in the next 30 days.
How do I fix CVE-2020-10714?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2020-10714?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST