CVE-2020-10736

HIGHCVSS 8/10EPSS 0.65%

Last modified

CVE-2020-10736 is a high-severity vulnerability rated 8/10 on the CVSS scale. An authorization bypass vulnerability was found in Ceph versions 15.2.0 before 15.2.2, where the ceph-mon and ceph-mgr daemons do not properly restrict access, resulting in gaining access to unauthorized resources. This flaw allows an authenticated client to modify the configuration and possibly conduct further attacks.. EPSS estimates a 0.65% chance of exploitation in the next 30 days.

Description

An authorization bypass vulnerability was found in Ceph versions 15.2.0 before 15.2.2, where the ceph-mon and ceph-mgr daemons do not properly restrict access, resulting in gaining access to unauthorized resources. This flaw allows an authenticated client to modify the configuration and possibly conduct further attacks.

Metrics

CVSS 3.1
8/10

CVSS:3.1/AV:A/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.65%

46.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LinuxfoundationCeph>= 15.2.0, < 15.2.2

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2020-10736?
An authorization bypass vulnerability was found in Ceph versions 15.2.0 before 15.2.2, where the ceph-mon and ceph-mgr daemons do not properly restrict access, resulting in gaining access to unauthorized resources. This flaw allows an authenticated client to modify the configuration and possibly conduct further attacks.
How severe is CVE-2020-10736?
CVE-2020-10736 has a CVSS score of 8/10 (HIGH severity). The EPSS model estimates a 0.65% probability of exploitation in the next 30 days.
How do I fix CVE-2020-10736?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2020-10736?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST