CVE-2020-11015

CRITICALCVSS 9.1/10EPSS 0.72%

Last modified

CVE-2020-11015 is a critical-severity vulnerability rated 9.1/10 on the CVSS scale. A vulnerability has been disclosed in thinx-device-api IoT Device Management Server before version 2.5.0. Device MAC address can be spoofed. EPSS estimates a 0.72% chance of exploitation in the next 30 days.

Description

A vulnerability has been disclosed in thinx-device-api IoT Device Management Server before version 2.5.0. Device MAC address can be spoofed. This means initial registration requests without UDID and spoofed MAC address may pass to create new UDID with same MAC address. Full impact needs to be reviewed further. Applies to all (mostly ESP8266/ESP32) users. This has been fixed in firmware version 2.5.0.

Metrics

CVSS 3.1
9.1/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:N

EPSS Probability
0.72%

49.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
Thinx-Device-Api ProjectThinx-Device-Api< 2.5.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2020-11015?
A vulnerability has been disclosed in thinx-device-api IoT Device Management Server before version 2.5.0. Device MAC address can be spoofed. This means initial registration requests without UDID and spoofed MAC address may pass to create new UDID with same MAC address. Full impact needs to be reviewed further. Applies to all (mostly ESP8266/ESP32) users. This has been fixed in firmware version 2.5.0.
How severe is CVE-2020-11015?
CVE-2020-11015 has a CVSS score of 9.1/10 (CRITICAL severity). The EPSS model estimates a 0.72% probability of exploitation in the next 30 days.
How do I fix CVE-2020-11015?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2020-11015?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST