CVE-2020-14501

CRITICALCVSS 9.8/10EPSS 1.70%

Last modified

CVE-2020-14501 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. Advantech iView, versions 5.6 and prior, has an improper authentication for critical function (CWE-306) issue. Successful exploitation of this vulnerability may allow an attacker to obtain the information of the user table, including the administrator credentials in plain text. EPSS estimates a 1.70% chance of exploitation in the next 30 days.

Description

Advantech iView, versions 5.6 and prior, has an improper authentication for critical function (CWE-306) issue. Successful exploitation of this vulnerability may allow an attacker to obtain the information of the user table, including the administrator credentials in plain text. An attacker may also delete the administrator account.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
1.70%

74.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
AdvantechIview<= 5.6

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2020-14501?
Advantech iView, versions 5.6 and prior, has an improper authentication for critical function (CWE-306) issue. Successful exploitation of this vulnerability may allow an attacker to obtain the information of the user table, including the administrator credentials in plain text. An attacker may also delete the administrator account.
How severe is CVE-2020-14501?
CVE-2020-14501 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 1.70% probability of exploitation in the next 30 days.
How do I fix CVE-2020-14501?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2020-14501?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST