CVE-2020-1807

LOWCVSS 3.5/10EPSS 0.22%

Last modified

CVE-2020-1807 is a low-severity vulnerability rated 3.5/10 on the CVSS scale. HUAWEI Mate 20 smartphones with versions earlier than 10.0.0.188(C00E74R3P8) have an improper authorization vulnerability. The software does not properly restrict certain user's modification of certain configuration file, successful exploit could allow the attacker to bypass app lock after a series of operation in ADB mode.. EPSS estimates a 0.22% chance of exploitation in the next 30 days.

Description

HUAWEI Mate 20 smartphones with versions earlier than 10.0.0.188(C00E74R3P8) have an improper authorization vulnerability. The software does not properly restrict certain user's modification of certain configuration file, successful exploit could allow the attacker to bypass app lock after a series of operation in ADB mode.

Metrics

CVSS 3.1
3.5/10

CVSS:3.1/AV:P/AC:L/PR:N/UI:N/S:U/C:L/I:L/A:N

EPSS Probability
0.22%

12.8th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
HuaweiMate 20 Firmware< 10.0.0.188\(c00e74r3p8\)

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2020-1807?
HUAWEI Mate 20 smartphones with versions earlier than 10.0.0.188(C00E74R3P8) have an improper authorization vulnerability. The software does not properly restrict certain user's modification of certain configuration file, successful exploit could allow the attacker to bypass app lock after a series of operation in ADB mode.
How severe is CVE-2020-1807?
CVE-2020-1807 has a CVSS score of 3.5/10 (LOW severity). The EPSS model estimates a 0.22% probability of exploitation in the next 30 days.
How do I fix CVE-2020-1807?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2020-1807?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST