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CVE-2020-26834

MEDIUMCVSS 5.4/10EPSS 0.68%

Last modified

CVE-2020-26834 is a medium-severity vulnerability rated 5.4/10 on the CVSS scale. SAP HANA Database, version - 2.0, does not correctly validate the username when performing SAML bearer token-based user authentication. It is possible to manipulate a valid existing SAML bearer token to authenticate as a user whose name is identical to the truncated username for whom the SAML bearer token was issued.. EPSS estimates a 0.68% chance of exploitation in the next 30 days.

Description

SAP HANA Database, version - 2.0, does not correctly validate the username when performing SAML bearer token-based user authentication. It is possible to manipulate a valid existing SAML bearer token to authenticate as a user whose name is identical to the truncated username for whom the SAML bearer token was issued.

Metrics

CVSS 3.1
5.4/10

CVSS:3.1/AV:N/AC:L/PR:L/UI:N/S:U/C:L/I:L/A:N

EPSS Probability
0.68%

47.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
SapHana Database2.00

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2020-26834?
SAP HANA Database, version - 2.0, does not correctly validate the username when performing SAML bearer token-based user authentication. It is possible to manipulate a valid existing SAML bearer token to authenticate as a user whose name is identical to the truncated username for whom the SAML bearer token was issued.
How severe is CVE-2020-26834?
CVE-2020-26834 has a CVSS score of 5.4/10 (MEDIUM severity). The EPSS model estimates a 0.68% probability of exploitation in the next 30 days.
How do I fix CVE-2020-26834?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2020-26834?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST