CVE-2020-6091

CRITICALCVSS 9.1/10EPSS 2.25%

Last modified

CVE-2020-6091 is a critical-severity vulnerability rated 9.1/10 on the CVSS scale. An exploitable authentication bypass vulnerability exists in the ESPON Web Control functionality of Epson EB-1470Ui MAIN: 98009273ESWWV107 MAIN2: 8X7325WWV303. A specially crafted series of HTTP requests can cause authentication bypass resulting in information disclosure. EPSS estimates a 2.25% chance of exploitation in the next 30 days.

Description

An exploitable authentication bypass vulnerability exists in the ESPON Web Control functionality of Epson EB-1470Ui MAIN: 98009273ESWWV107 MAIN2: 8X7325WWV303. A specially crafted series of HTTP requests can cause authentication bypass resulting in information disclosure. An attacker can send an HTTP request to trigger this vulnerability.

Metrics

CVSS 3.1
9.1/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:N

EPSS Probability
2.25%

80.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
EpsonEb-1470ui FirmwareAll versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2020-6091?
An exploitable authentication bypass vulnerability exists in the ESPON Web Control functionality of Epson EB-1470Ui MAIN: 98009273ESWWV107 MAIN2: 8X7325WWV303. A specially crafted series of HTTP requests can cause authentication bypass resulting in information disclosure. An attacker can send an HTTP request to trigger this vulnerability.
How severe is CVE-2020-6091?
CVE-2020-6091 has a CVSS score of 9.1/10 (CRITICAL severity). The EPSS model estimates a 2.25% probability of exploitation in the next 30 days.
How do I fix CVE-2020-6091?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2020-6091?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST