CVE-2020-6653

LOWCVSS 3.9/10EPSS 0.26%

Last modified

CVE-2020-6653 is a low-severity vulnerability rated 3.9/10 on the CVSS scale. Eaton's Secure connect mobile app v1.7.3 & prior stores the user login credentials in logcat file when user create or register the account on the Mobile app. A malicious app or unauthorized user can harvest the information and later on can use the information to monitor and control the user's account and associated devices.. EPSS estimates a 0.26% chance of exploitation in the next 30 days.

Description

Eaton's Secure connect mobile app v1.7.3 & prior stores the user login credentials in logcat file when user create or register the account on the Mobile app. A malicious app or unauthorized user can harvest the information and later on can use the information to monitor and control the user's account and associated devices.

Metrics

CVSS 3.1
3.9/10

CVSS:3.1/AV:P/AC:L/PR:H/UI:N/S:U/C:H/I:N/A:N

EPSS Probability
0.26%

17.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
EatonSecureconnect<= 1.7.3

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2020-6653?
Eaton's Secure connect mobile app v1.7.3 & prior stores the user login credentials in logcat file when user create or register the account on the Mobile app. A malicious app or unauthorized user can harvest the information and later on can use the information to monitor and control the user's account and associated devices.
How severe is CVE-2020-6653?
CVE-2020-6653 has a CVSS score of 3.9/10 (LOW severity). The EPSS model estimates a 0.26% probability of exploitation in the next 30 days.
How do I fix CVE-2020-6653?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2020-6653?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST