CVE-2020-6867

MEDIUMCVSS 5.5/10EPSS 0.35%

Last modified

CVE-2020-6867 is a medium-severity vulnerability rated 5.5/10 on the CVSS scale. ZTE's SDON controller is impacted by the resource management error vulnerability. When RPC is frequently called by other applications in the case of mass traffic data in the system, it will result in no response for a long time and memory overflow risk. EPSS estimates a 0.35% chance of exploitation in the next 30 days.

Description

ZTE's SDON controller is impacted by the resource management error vulnerability. When RPC is frequently called by other applications in the case of mass traffic data in the system, it will result in no response for a long time and memory overflow risk. This affects: ZENIC ONE R22b versions V16.19.10P02SP002 and V16.19.10P02SP005.

Metrics

CVSS 3.1
5.5/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:N/I:N/A:H

EPSS Probability
0.35%

26.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
ZteZenic One R22b6.19.10p02sp005
ZteZenic One R22b16.19.10p02sp002

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2020-6867?
ZTE's SDON controller is impacted by the resource management error vulnerability. When RPC is frequently called by other applications in the case of mass traffic data in the system, it will result in no response for a long time and memory overflow risk. This affects: ZENIC ONE R22b versions V16.19.10P02SP002 and V16.19.10P02SP005.
How severe is CVE-2020-6867?
CVE-2020-6867 has a CVSS score of 5.5/10 (MEDIUM severity). The EPSS model estimates a 0.35% probability of exploitation in the next 30 days.
How do I fix CVE-2020-6867?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2020-6867?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST