Strix
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CVE-2021-21539

HIGHCVSS 7.1/10EPSS 0.62%

Last modified

CVE-2021-21539 is a high-severity vulnerability rated 7.1/10 on the CVSS scale. Dell EMC iDRAC9 versions prior to 4.40.00.00 contain a Time-of-check Time-of-use (TOCTOU) race condition vulnerability. A remote authenticated attacker could potentially exploit this vulnerability to gain elevated privileges when a user with higher privileges is simultaneously accessing iDRAC through the web interface.. EPSS estimates a 0.62% chance of exploitation in the next 30 days.

Description

Dell EMC iDRAC9 versions prior to 4.40.00.00 contain a Time-of-check Time-of-use (TOCTOU) race condition vulnerability. A remote authenticated attacker could potentially exploit this vulnerability to gain elevated privileges when a user with higher privileges is simultaneously accessing iDRAC through the web interface.

Metrics

CVSS 3.1
7.1/10

CVSS:3.1/AV:N/AC:H/PR:L/UI:R/S:U/C:H/I:H/A:H

EPSS Probability
0.62%

44.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
DellIdrac9 Firmware< 4.40.00.00

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2021-21539?
Dell EMC iDRAC9 versions prior to 4.40.00.00 contain a Time-of-check Time-of-use (TOCTOU) race condition vulnerability. A remote authenticated attacker could potentially exploit this vulnerability to gain elevated privileges when a user with higher privileges is simultaneously accessing iDRAC through the web interface.
How severe is CVE-2021-21539?
CVE-2021-21539 has a CVSS score of 7.1/10 (HIGH severity). The EPSS model estimates a 0.62% probability of exploitation in the next 30 days.
How do I fix CVE-2021-21539?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2021-21539?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST