CVE-2021-22374
HIGHCVSS 7.5/10EPSS 0.68%
Last modified
CVE-2021-22374 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. There is an Improper Validation of Array Index Vulnerability in Huawei Smartphone. Successful exploitation of this vulnerability may cause stability risks.. EPSS estimates a 0.68% chance of exploitation in the next 30 days.
Description
There is an Improper Validation of Array Index Vulnerability in Huawei Smartphone. Successful exploitation of this vulnerability may cause stability risks.
Metrics
CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Huawei | Emui | 10.1.1 |
| Huawei | Emui | 11.0.0 |
| Huawei | Emui | 11.0.1 |
| Huawei | Magic Ui | 3.1.1 |
| Huawei | Magic Ui | 4.0.0 |
References
- https://consumer.huawei.com/en/support/bulletin/2021/5/Vendor Advisory
- https://consumer.huawei.com/en/support/bulletin/2021/5/Vendor Advisory
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2021-22374?
There is an Improper Validation of Array Index Vulnerability in Huawei Smartphone. Successful exploitation of this vulnerability may cause stability risks.
How severe is CVE-2021-22374?
CVE-2021-22374 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 0.68% probability of exploitation in the next 30 days.
How do I fix CVE-2021-22374?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
How Strix Helps
- How Strix found a critical auth bypass in etcdStrix autonomously discovered a critical authentication bypass in etcd, later designated CVE-2026-33413.
- Autonomous PentestingAI agents that find and validate exploitable vulnerabilities like this one across your applications.
- PR ReviewsPentest every pull request so vulnerable code is caught before it ships to production.
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Are you affected by CVE-2021-22374?
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Scan your code nowSource: NVD / NIST