CVE-2021-25379
LOWCVSS 3.3/10EPSS 0.21%
Last modified
CVE-2021-25379 is a low-severity vulnerability rated 3.3/10 on the CVSS scale. Intent redirection vulnerability in Gallery prior to version 5.4.16.1 allows attacker to execute privileged action.. EPSS estimates a 0.21% chance of exploitation in the next 30 days.
Description
Intent redirection vulnerability in Gallery prior to version 5.4.16.1 allows attacker to execute privileged action.
Metrics
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:N/A:N
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Samsung | Gallery | < 5.4.16.1 |
References
- https://security.samsungmobile.com/Vendor Advisory
- https://security.samsungmobile.com/serviceWeb.smsbVendor Advisory
- https://security.samsungmobile.com/Vendor Advisory
- https://security.samsungmobile.com/serviceWeb.smsbVendor Advisory
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2021-25379?
Intent redirection vulnerability in Gallery prior to version 5.4.16.1 allows attacker to execute privileged action.
How severe is CVE-2021-25379?
CVE-2021-25379 has a CVSS score of 3.3/10 (LOW severity). The EPSS model estimates a 0.21% probability of exploitation in the next 30 days.
How do I fix CVE-2021-25379?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
How Strix Helps
- How Strix found a critical auth bypass in etcdStrix autonomously discovered a critical authentication bypass in etcd, later designated CVE-2026-33413.
- Autonomous PentestingAI agents that find and validate exploitable vulnerabilities like this one across your applications.
- PR ReviewsPentest every pull request so vulnerable code is caught before it ships to production.
- AI Penetration TestingHow AI-driven penetration testing continuously covers your attack surface.
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Are you affected by CVE-2021-25379?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST