CVE-2021-29657

HIGHCVSS 7.4/10EPSS 0.41%

Last modified

CVE-2021-29657 is a high-severity vulnerability rated 7.4/10 on the CVSS scale. arch/x86/kvm/svm/nested.c in the Linux kernel before 5.11.12 has a use-after-free in which an AMD KVM guest can bypass access control on host OS MSRs when there are nested guests, aka CID-a58d9166a756. This occurs because of a TOCTOU race condition associated with a VMCB12 double fetch in nested_svm_vmrun.. EPSS estimates a 0.41% chance of exploitation in the next 30 days.

Description

arch/x86/kvm/svm/nested.c in the Linux kernel before 5.11.12 has a use-after-free in which an AMD KVM guest can bypass access control on host OS MSRs when there are nested guests, aka CID-a58d9166a756. This occurs because of a TOCTOU race condition associated with a VMCB12 double fetch in nested_svm_vmrun.

Metrics

CVSS 3.1
7.4/10

CVSS:3.1/AV:L/AC:H/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.41%

32.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LinuxLinux Kernel>= 5.10, < 5.10.28
LinuxLinux Kernel>= 5.11, < 5.11.12

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2021-29657?
arch/x86/kvm/svm/nested.c in the Linux kernel before 5.11.12 has a use-after-free in which an AMD KVM guest can bypass access control on host OS MSRs when there are nested guests, aka CID-a58d9166a756. This occurs because of a TOCTOU race condition associated with a VMCB12 double fetch in nested_svm_vmrun.
How severe is CVE-2021-29657?
CVE-2021-29657 has a CVSS score of 7.4/10 (HIGH severity). The EPSS model estimates a 0.41% probability of exploitation in the next 30 days.
How do I fix CVE-2021-29657?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2021-29657?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST