CVE-2021-30162

HIGHCVSS 7.1/10EPSS 0.11%

Last modified

CVE-2021-30162 is a high-severity vulnerability rated 7.1/10 on the CVSS scale. An issue was discovered on LG mobile devices with Android OS 4.4 through 11 software. Attackers can leverage ISMS services to bypass access control on specific content providers. EPSS estimates a 0.11% chance of exploitation in the next 30 days.

Description

An issue was discovered on LG mobile devices with Android OS 4.4 through 11 software. Attackers can leverage ISMS services to bypass access control on specific content providers. The LG ID is LVE-SMP-210003 (April 2021).

Metrics

CVSS 3.1
7.1/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:N

EPSS Probability
0.11%

1.7th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
GoogleAndroid4.4
GoogleAndroid4.4.1
GoogleAndroid4.4.2
GoogleAndroid4.4.3
GoogleAndroid4.4.4
GoogleAndroid5.0
GoogleAndroid5.0.1
GoogleAndroid5.0.2
GoogleAndroid5.1
GoogleAndroid5.1.0
GoogleAndroid5.1.1
GoogleAndroid6.0
GoogleAndroid6.0.1
GoogleAndroid7.0
GoogleAndroid7.1.0
GoogleAndroid7.1.1
GoogleAndroid7.1.2
GoogleAndroid8.0
GoogleAndroid8.1
GoogleAndroid9.0
GoogleAndroid10.0
GoogleAndroid11.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2021-30162?
An issue was discovered on LG mobile devices with Android OS 4.4 through 11 software. Attackers can leverage ISMS services to bypass access control on specific content providers. The LG ID is LVE-SMP-210003 (April 2021).
How severe is CVE-2021-30162?
CVE-2021-30162 has a CVSS score of 7.1/10 (HIGH severity). The EPSS model estimates a 0.11% probability of exploitation in the next 30 days.
How do I fix CVE-2021-30162?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2021-30162?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST