CVE-2021-30761

HIGHCVSS 8.8/10Actively ExploitedEPSS 10.59%

Last modified

CVE-2021-30761 is a high-severity vulnerability rated 8.8/10 on the CVSS scale. A memory corruption issue was addressed with improved state management. This issue is fixed in iOS 12.5.4. CISA has confirmed active exploitation in the wild. EPSS estimates a 10.59% chance of exploitation in the next 30 days.

Description

A memory corruption issue was addressed with improved state management. This issue is fixed in iOS 12.5.4. Processing maliciously crafted web content may lead to arbitrary code execution. Apple is aware of a report that this issue may have been actively exploited..

Metrics

CVSS 3.1
8.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:R/S:U/C:H/I:H/A:H

EPSS Probability
10.59%

95.2th percentile

Probability of exploitation in the next 30 days. Learn more

Exploitation Status

This vulnerability is listed in CISA’s Known Exploited Vulnerabilities catalog, confirming active exploitation in the wild. Federal agencies must remediate by .

Weakness Enumeration

Affected Software

VendorProductVersions
AppleIphone Os< 12.5.4

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2021-30761?
A memory corruption issue was addressed with improved state management. This issue is fixed in iOS 12.5.4. Processing maliciously crafted web content may lead to arbitrary code execution. Apple is aware of a report that this issue may have been actively exploited..
How severe is CVE-2021-30761?
CVE-2021-30761 has a CVSS score of 8.8/10 (HIGH severity). The EPSS model estimates a 10.59% probability of exploitation in the next 30 days. This vulnerability is listed in CISA's Known Exploited Vulnerabilities catalog.
How do I fix CVE-2021-30761?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2021-30761?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST