CVE-2021-33323

HIGHCVSS 7.5/10EPSS 1.03%

Last modified

CVE-2021-33323 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. The Dynamic Data Mapping module in Liferay Portal 7.1.0 through 7.3.2, and Liferay DXP 7.1 before fix pack 19, and 7.2 before fix pack 7, autosaves form values for unauthenticated users, which allows remote attackers to view the autosaved values by viewing the form as an unauthenticated user.. EPSS estimates a 1.03% chance of exploitation in the next 30 days.

Description

The Dynamic Data Mapping module in Liferay Portal 7.1.0 through 7.3.2, and Liferay DXP 7.1 before fix pack 19, and 7.2 before fix pack 7, autosaves form values for unauthenticated users, which allows remote attackers to view the autosaved values by viewing the form as an unauthenticated user.

Metrics

CVSS 3.1
7.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:N/A:N

EPSS Probability
1.03%

59.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LiferayDigital Experience Platform7.1
LiferayDigital Experience Platform7.2
LiferayLiferay Portal>= 7.1.0, < 7.3.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2021-33323?
The Dynamic Data Mapping module in Liferay Portal 7.1.0 through 7.3.2, and Liferay DXP 7.1 before fix pack 19, and 7.2 before fix pack 7, autosaves form values for unauthenticated users, which allows remote attackers to view the autosaved values by viewing the form as an unauthenticated user.
How severe is CVE-2021-33323?
CVE-2021-33323 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 1.03% probability of exploitation in the next 30 days.
How do I fix CVE-2021-33323?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2021-33323?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST