CVE-2021-3404
HIGHCVSS 7.8/10EPSS 1.93%
Last modified
CVE-2021-3404 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. In ytnef 1.9.3, the SwapWord function in lib/ytnef.c allows remote attackers to cause a denial-of-service (and potentially code execution) due to a heap buffer overflow which can be triggered via a crafted file.. EPSS estimates a 1.93% chance of exploitation in the next 30 days.
Description
In ytnef 1.9.3, the SwapWord function in lib/ytnef.c allows remote attackers to cause a denial-of-service (and potentially code execution) due to a heap buffer overflow which can be triggered via a crafted file.
Metrics
CVSS:3.1/AV:L/AC:L/PR:N/UI:R/S:U/C:H/I:H/A:H
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Ytnef Project | Ytnef | 1.9.3 |
| Redhat | Enterprise Linux | 7.0 |
| Fedoraproject | Fedora | 33 |
References
- https://bugzilla.redhat.com/show_bug.cgi?id=1926965Issue Tracking, Third Party Advisory
- https://github.com/Yeraze/ytnef/issues/86Exploit, Issue Tracking, Third Party Advisory
- https://bugzilla.redhat.com/show_bug.cgi?id=1926965Issue Tracking, Third Party Advisory
- https://github.com/Yeraze/ytnef/issues/86Exploit, Issue Tracking, Third Party Advisory
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2021-3404?
In ytnef 1.9.3, the SwapWord function in lib/ytnef.c allows remote attackers to cause a denial-of-service (and potentially code execution) due to a heap buffer overflow which can be triggered via a crafted file.
How severe is CVE-2021-3404?
CVE-2021-3404 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 1.93% probability of exploitation in the next 30 days.
How do I fix CVE-2021-3404?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
Are you affected by CVE-2021-3404?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST
