CVE-2021-42976

HIGHCVSS 8.8/10EPSS 0.46%

Last modified

CVE-2021-42976 is a high-severity vulnerability rated 8.8/10 on the CVSS scale. NoMachine Enterprise Desktop is affected by Buffer Overflow. IOCTL Handler 0x22001B in the NoMachine Enterprise Desktop above 4.0.346 and below 7.7.4 allow local attackers to execute arbitrary code in kernel mode or cause a denial of service (memory corruption and OS crash) via specially crafted I/O Request Packet.. EPSS estimates a 0.46% chance of exploitation in the next 30 days.

Description

NoMachine Enterprise Desktop is affected by Buffer Overflow. IOCTL Handler 0x22001B in the NoMachine Enterprise Desktop above 4.0.346 and below 7.7.4 allow local attackers to execute arbitrary code in kernel mode or cause a denial of service (memory corruption and OS crash) via specially crafted I/O Request Packet.

Metrics

CVSS 3.1
8.8/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:C/C:H/I:H/A:H

EPSS Probability
0.46%

36.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
NomachineEnterprise Desktop> 4.0.346, < 7.7.4

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2021-42976?
NoMachine Enterprise Desktop is affected by Buffer Overflow. IOCTL Handler 0x22001B in the NoMachine Enterprise Desktop above 4.0.346 and below 7.7.4 allow local attackers to execute arbitrary code in kernel mode or cause a denial of service (memory corruption and OS crash) via specially crafted I/O Request Packet.
How severe is CVE-2021-42976?
CVE-2021-42976 has a CVSS score of 8.8/10 (HIGH severity). The EPSS model estimates a 0.46% probability of exploitation in the next 30 days.
How do I fix CVE-2021-42976?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2021-42976?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST