CVE-2021-44880

CRITICALCVSS 9.8/10EPSS 4.22%

Last modified

CVE-2021-44880 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. D-Link devices DIR_878 DIR_878_FW1.30B08_Hotfix_02 and DIR_882 DIR_882_FW1.30B06_Hotfix_02 were discovered to contain a command injection vulnerability in the system function. This vulnerability allows attackers to execute arbitrary commands via a crafted HNAP1 POST request.. EPSS estimates a 4.22% chance of exploitation in the next 30 days.

Description

D-Link devices DIR_878 DIR_878_FW1.30B08_Hotfix_02 and DIR_882 DIR_882_FW1.30B06_Hotfix_02 were discovered to contain a command injection vulnerability in the system function. This vulnerability allows attackers to execute arbitrary commands via a crafted HNAP1 POST request.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
4.22%

89.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersionsUpdate
DlinkDir-878 Firmware<= 1.20b05
DlinkDir-878 Firmware1.30b08Hotfix 02 Beta
DlinkDir-882 Firmware<= 1.30b06
DlinkDir-882 Firmware1.30b06Hotfix 02 Beta

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2021-44880?
D-Link devices DIR_878 DIR_878_FW1.30B08_Hotfix_02 and DIR_882 DIR_882_FW1.30B06_Hotfix_02 were discovered to contain a command injection vulnerability in the system function. This vulnerability allows attackers to execute arbitrary commands via a crafted HNAP1 POST request.
How severe is CVE-2021-44880?
CVE-2021-44880 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 4.22% probability of exploitation in the next 30 days.
How do I fix CVE-2021-44880?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2021-44880?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST