CVE-2021-47206

MEDIUMCVSS 5.5/10EPSS 0.23%

Last modified

CVE-2021-47206 is a medium-severity vulnerability rated 5.5/10 on the CVSS scale. In the Linux kernel, the following vulnerability has been resolved: usb: host: ohci-tmio: check return value after calling platform_get_resource() It will cause null-ptr-deref if platform_get_resource() returns NULL, we need check the return value.. EPSS estimates a 0.23% chance of exploitation in the next 30 days.

Description

In the Linux kernel, the following vulnerability has been resolved: usb: host: ohci-tmio: check return value after calling platform_get_resource() It will cause null-ptr-deref if platform_get_resource() returns NULL, we need check the return value.

Metrics

CVSS 3.1
5.5/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:N/I:N/A:H

EPSS Probability
0.23%

13.5th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LinuxLinux Kernel< 4.4.293
LinuxLinux Kernel>= 4.5, < 4.9.291
LinuxLinux Kernel>= 4.10, < 4.14.256
LinuxLinux Kernel>= 4.15, < 4.19.218
LinuxLinux Kernel>= 4.20, < 5.4.162
LinuxLinux Kernel>= 5.5, < 5.10.82
LinuxLinux Kernel>= 5.11, < 5.15.5

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2021-47206?
In the Linux kernel, the following vulnerability has been resolved: usb: host: ohci-tmio: check return value after calling platform_get_resource() It will cause null-ptr-deref if platform_get_resource() returns NULL, we need check the return value.
How severe is CVE-2021-47206?
CVE-2021-47206 has a CVSS score of 5.5/10 (MEDIUM severity). The EPSS model estimates a 0.23% probability of exploitation in the next 30 days.
How do I fix CVE-2021-47206?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2021-47206?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST