CVE-2022-1622

MEDIUMCVSS 5.5/10EPSS 1.66%

Last modified

CVE-2022-1622 is a medium-severity vulnerability rated 5.5/10 on the CVSS scale. LibTIFF master branch has an out-of-bounds read in LZWDecode in libtiff/tif_lzw.c:619, allowing attackers to cause a denial-of-service via a crafted tiff file. For users that compile libtiff from sources, the fix is available with commit b4e79bfa.. EPSS estimates a 1.66% chance of exploitation in the next 30 days.

Description

LibTIFF master branch has an out-of-bounds read in LZWDecode in libtiff/tif_lzw.c:619, allowing attackers to cause a denial-of-service via a crafted tiff file. For users that compile libtiff from sources, the fix is available with commit b4e79bfa.

Metrics

CVSS 3.1
5.5/10

CVSS:3.1/AV:L/AC:L/PR:N/UI:R/S:U/C:N/I:N/A:H

EPSS Probability
1.66%

73.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LibtiffLibtiff4.3.0
FedoraprojectFedora35
FedoraprojectFedora36
NetappOntap Select Deploy Administration UtilityAll versions
AppleIphone Os< 16.0
AppleMacos>= 11.0, < 11.7
AppleMacos>= 12.0, < 12.6
AppleTvos< 16.0
AppleWatchos< 9.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-1622?
LibTIFF master branch has an out-of-bounds read in LZWDecode in libtiff/tif_lzw.c:619, allowing attackers to cause a denial-of-service via a crafted tiff file. For users that compile libtiff from sources, the fix is available with commit b4e79bfa.
How severe is CVE-2022-1622?
CVE-2022-1622 has a CVSS score of 5.5/10 (MEDIUM severity). The EPSS model estimates a 1.66% probability of exploitation in the next 30 days.
How do I fix CVE-2022-1622?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-1622?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST