CVE-2022-20010

Name: CVE-2022-20010
Creator: NVD / NIST
Published: 2022-05-10T20:15:09.107+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

MEDIUMCVSS 6.5/10EPSS 0.26%

Last modified Jun 17, 2026

CVE-2022-20010 is a medium-severity vulnerability rated 6.5/10 on the CVSS scale. In l2cble_process_sig_cmd of l2c_ble.cc, there is a possible out of bounds read due to an incorrect bounds check. This could lead to remote information disclosure through Bluetooth with no additional execution privileges needed. EPSS estimates a 0.26% chance of exploitation in the next 30 days.

Description

In l2cble_process_sig_cmd of l2c_ble.cc, there is a possible out of bounds read due to an incorrect bounds check. This could lead to remote information disclosure through Bluetooth with no additional execution privileges needed. User interaction is not needed for exploitation.Product: AndroidVersions: Android-12 Android-12LAndroid ID: A-213519176

Metrics

CVSS 3.1

6.5/10

CVSS:3.1/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:N/A:N

EPSS Probability

0.26%

16.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-125

Affected Software

Vendor	Product	Versions
Google	Android	12.0
Google	Android	12.1

References

https://source.android.com/security/bulletin/2022-05-01Patch, Vendor Advisory
https://source.android.com/security/bulletin/2022-05-01Patch, Vendor Advisory

Timeline

Published: May 10, 2022
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2022-20010?

How severe is CVE-2022-20010?

CVE-2022-20010 has a CVSS score of 6.5/10 (MEDIUM severity). The EPSS model estimates a 0.26% probability of exploitation in the next 30 days.

How do I fix CVE-2022-20010?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-20010?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST