CVE-2022-20130

Name: CVE-2022-20130
Creator: NVD / NIST
Published: 2022-06-15T13:15:08.667+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

CRITICALCVSS 9.8/10EPSS 8.33%

Last modified Jun 17, 2026

CVE-2022-20130 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. In transportDec_OutOfBandConfig of tpdec_lib.cpp, there is a possible out of bounds write due to a heap buffer overflow. This could lead to remote code execution with no additional execution privileges needed. EPSS estimates a 8.33% chance of exploitation in the next 30 days.

Description

In transportDec_OutOfBandConfig of tpdec_lib.cpp, there is a possible out of bounds write due to a heap buffer overflow. This could lead to remote code execution with no additional execution privileges needed. User interaction is not needed for exploitation.Product: AndroidVersions: Android-10 Android-11 Android-12 Android-12LAndroid ID: A-224314979

Metrics

CVSS 3.1

9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability

8.33%

94.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-754

Affected Software

Vendor	Product	Versions
Google	Android	10.0
Google	Android	11.0
Google	Android	12.0
Google	Android	12.1

References

https://source.android.com/security/bulletin/2022-06-01Vendor Advisory
https://source.android.com/security/bulletin/2022-06-01Vendor Advisory

Timeline

Published: Jun 15, 2022
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2022-20130?

How severe is CVE-2022-20130?

CVE-2022-20130 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 8.33% probability of exploitation in the next 30 days.

How do I fix CVE-2022-20130?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-20130?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST