CVE-2022-20147

HIGHCVSS 7.8/10EPSS 0.11%

Last modified

CVE-2022-20147 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. In nfa_dm_check_set_config of nfa_dm_main.cc, there is a possible out of bounds write due to a missing bounds check. This could lead to local escalation of privilege with no additional execution privileges needed. EPSS estimates a 0.11% chance of exploitation in the next 30 days.

Description

In nfa_dm_check_set_config of nfa_dm_main.cc, there is a possible out of bounds write due to a missing bounds check. This could lead to local escalation of privilege with no additional execution privileges needed. User interaction is not needed for exploitation.Product: AndroidVersions: Android-10 Android-11 Android-12 Android-12LAndroid ID: A-221216105

Metrics

CVSS 3.1
7.8/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.11%

1.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
GoogleAndroid10.0
GoogleAndroid11.0
GoogleAndroid12.0
GoogleAndroid12.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-20147?
In nfa_dm_check_set_config of nfa_dm_main.cc, there is a possible out of bounds write due to a missing bounds check. This could lead to local escalation of privilege with no additional execution privileges needed. User interaction is not needed for exploitation.Product: AndroidVersions: Android-10 Android-11 Android-12 Android-12LAndroid ID: A-221216105
How severe is CVE-2022-20147?
CVE-2022-20147 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 0.11% probability of exploitation in the next 30 days.
How do I fix CVE-2022-20147?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-20147?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST