CVE-2022-20233

Name: CVE-2022-20233
Creator: NVD / NIST
Published: 2022-06-15T14:15:13.57+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

MEDIUMCVSS 6.7/10EPSS 0.13%

Last modified Jun 17, 2026

CVE-2022-20233 is a medium-severity vulnerability rated 6.7/10 on the CVSS scale. In param_find_digests_internal and related functions of the Titan-M source, there is a possible out of bounds write due to an incorrect bounds check. This could lead to local escalation of privilege with System execution privileges needed. EPSS estimates a 0.13% chance of exploitation in the next 30 days.

Description

In param_find_digests_internal and related functions of the Titan-M source, there is a possible out of bounds write due to an incorrect bounds check. This could lead to local escalation of privilege with System execution privileges needed. User interaction is not needed for exploitation.Product: AndroidVersions: Android kernelAndroid ID: A-222472803References: N/A

Metrics

CVSS 3.1

6.7/10

CVSS:3.1/AV:L/AC:L/PR:H/UI:N/S:U/C:H/I:H/A:H

EPSS Probability

0.13%

2.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-787

Affected Software

Vendor	Product	Versions
Google	Android	All versions

References

https://source.android.com/security/bulletin/pixel/2022-06-01Vendor Advisory
https://source.android.com/security/bulletin/pixel/2022-06-01Vendor Advisory

Timeline

Published: Jun 15, 2022
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2022-20233?

How severe is CVE-2022-20233?

CVE-2022-20233 has a CVSS score of 6.7/10 (MEDIUM severity). The EPSS model estimates a 0.13% probability of exploitation in the next 30 days.

How do I fix CVE-2022-20233?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-20233?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST