CVE-2022-20293

Name: CVE-2022-20293
Creator: NVD / NIST
Published: 2022-08-12T15:15:11.063+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

MEDIUMCVSS 5.5/10EPSS 0.10%

Last modified Jun 17, 2026

CVE-2022-20293 is a medium-severity vulnerability rated 5.5/10 on the CVSS scale. In LauncherApps, there is a possible way to determine whether an app is installed, without query permissions, due to side channel information disclosure. This could lead to local information disclosure with no additional execution privileges needed. EPSS estimates a 0.10% chance of exploitation in the next 30 days.

Description

In LauncherApps, there is a possible way to determine whether an app is installed, without query permissions, due to side channel information disclosure. This could lead to local information disclosure with no additional execution privileges needed. User interaction is not needed for exploitation.Product: AndroidVersions: Android-13Android ID: A-202298672

Metrics

CVSS 3.1

5.5/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:N/A:N

EPSS Probability

0.10%

0.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-203

Affected Software

Vendor	Product	Versions
Google	Android	13.0

References

https://source.android.com/security/bulletin/android-13Vendor Advisory
https://source.android.com/security/bulletin/android-13Vendor Advisory

Timeline

Published: Aug 12, 2022
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2022-20293?

How severe is CVE-2022-20293?

CVE-2022-20293 has a CVSS score of 5.5/10 (MEDIUM severity). The EPSS model estimates a 0.10% probability of exploitation in the next 30 days.

How do I fix CVE-2022-20293?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-20293?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST