CVE-2022-20413

MEDIUMCVSS 5.5/10EPSS 0.25%

Last modified

CVE-2022-20413 is a medium-severity vulnerability rated 5.5/10 on the CVSS scale. In start of Threads.cpp, there is a possible way to record audio during a phone call due to a logic error in the code. This could lead to local information disclosure with User execution privileges needed. EPSS estimates a 0.25% chance of exploitation in the next 30 days.

Description

In start of Threads.cpp, there is a possible way to record audio during a phone call due to a logic error in the code. This could lead to local information disclosure with User execution privileges needed. User interaction is not needed for exploitation.Product: AndroidVersions: Android-10 Android-11 Android-12 Android-12L Android-13Android ID: A-235850634

Metrics

CVSS 3.1
5.5/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:N/A:N

EPSS Probability
0.25%

16.6th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
GoogleAndroid10.0
GoogleAndroid11.0
GoogleAndroid12.0
GoogleAndroid12.1
GoogleAndroid13.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-20413?
In start of Threads.cpp, there is a possible way to record audio during a phone call due to a logic error in the code. This could lead to local information disclosure with User execution privileges needed. User interaction is not needed for exploitation.Product: AndroidVersions: Android-10 Android-11 Android-12 Android-12L Android-13Android ID: A-235850634
How severe is CVE-2022-20413?
CVE-2022-20413 has a CVSS score of 5.5/10 (MEDIUM severity). The EPSS model estimates a 0.25% probability of exploitation in the next 30 days.
How do I fix CVE-2022-20413?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-20413?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST