CVE-2022-20494

MEDIUMCVSS 5.5/10EPSS 0.43%

Last modified

CVE-2022-20494 is a medium-severity vulnerability rated 5.5/10 on the CVSS scale. In AutomaticZenRule of AutomaticZenRule.java, there is a possible persistent DoS due to resource exhaustion. This could lead to local denial of service with no additional execution privileges needed. EPSS estimates a 0.43% chance of exploitation in the next 30 days.

Description

In AutomaticZenRule of AutomaticZenRule.java, there is a possible persistent DoS due to resource exhaustion. This could lead to local denial of service with no additional execution privileges needed. User interaction is not needed for exploitation.Product: AndroidVersions: Android-10 Android-11 Android-12 Android-12L Android-13Android ID: A-243794204

Metrics

CVSS 3.1
5.5/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:N/I:N/A:H

EPSS Probability
0.43%

34.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
GoogleAndroid10.0
GoogleAndroid11.0
GoogleAndroid12.0
GoogleAndroid12.1
GoogleAndroid13.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-20494?
In AutomaticZenRule of AutomaticZenRule.java, there is a possible persistent DoS due to resource exhaustion. This could lead to local denial of service with no additional execution privileges needed. User interaction is not needed for exploitation.Product: AndroidVersions: Android-10 Android-11 Android-12 Android-12L Android-13Android ID: A-243794204
How severe is CVE-2022-20494?
CVE-2022-20494 has a CVSS score of 5.5/10 (MEDIUM severity). The EPSS model estimates a 0.43% probability of exploitation in the next 30 days.
How do I fix CVE-2022-20494?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-20494?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST